Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10330726 | Apparatuses including test segment circuits having latch circuits for testing a semiconductor die | Kevin G. Werhane, Bin Liu | 2019-06-25 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10330726 | Apparatuses including test segment circuits having latch circuits for testing a semiconductor die | Kevin G. Werhane, Bin Liu | 2019-06-25 |