Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10497592 | Methods and apparatuses for estimating on-wafer oxide layer reduction effectiveness via color sensing | Manish Ranjan, Shantinath Ghongadi | 2019-12-03 |
| 10373858 | Chuck for edge bevel removal and method for centering a wafer prior to edge bevel removal | Aaron Louis LaBrie, Robert Lynden Braendle | 2019-08-06 |