Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10466031 | Apparatus for measuring thickness and surface profile of multilayered film structure using imaging spectral optical system and measuring method | Hyug-gyo Rhee, Yun-Woo Lee | 2019-11-05 |