Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10312049 | Sample chamber device for electron microscope, and electron microscope comprising same | Bok Lae Cho, Inho Sul | 2019-06-04 |
| 10283339 | Particle beam mass spectrometer and particle measurement method by means of same | Chang Joon Park, Cheolsu Han, Keu Chan Lee, Seok Rae Yoon | 2019-05-07 |