Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10475178 | System, method and computer program product for inspecting a wafer using a film thickness map generated for the wafer | — | 2019-11-12 |
| 10387601 | Methods to store dynamic layer content inside a design file | Thirupurasundari Jayaraman, Srikanth Kandukuri, Anil Raman, Kenong Wu, Praveen Gunasekaran +2 more | 2019-08-20 |