Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10324044 | Apparatus, method and computer program product for defect detection in work pieces | Tom Marivoet, Christophe Wouters | 2019-06-18 |
| 10190994 | Apparatus, method and computer program product for inspection of at least side faces of semiconductor devices | — | 2019-01-29 |