Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10475711 | Method for evaluating quality of oxide semiconductor thin film, method for managing quality of oxide semiconductor thin film, and device for manufacturing semiconductor using said method for managing quality | Mototaka Ochi, Toshihiro Kugimiya | 2019-11-12 |
| 10203367 | Quality evaluation method for laminate having protective layer on surface of oxide semiconductor thin film and quality control method for oxide semiconductor thin film | Aya Miki, Nobuyuki Kawakami | 2019-02-12 |