Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10319559 | Method and device for testing samples by means of an electron or ion beam microscope | Niels de Jonge | 2019-06-11 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10319559 | Method and device for testing samples by means of an electron or ion beam microscope | Niels de Jonge | 2019-06-11 |