Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10269534 | Mask position adjustment method of ion milling, electron microscope capable of adjusting mask position, mask adjustment device mounted on sample stage and sample mask component of ion milling device | Toru Iwaya, Hisayuki Takasu, Atsushi Kamino, Kento HORINOUCHI | 2019-04-23 |