Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10417756 | Pattern measurement apparatus and defect inspection apparatus | Satoru Yamaguchi, Kazuyuki Hirao, Yasunori Takasugi | 2019-09-17 |
| 10197783 | Image-forming device, and dimension measurement device | Yasunori Takasugi, Satoru Yamaguchi, Kazuyuki Hirao | 2019-02-05 |