Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10256155 | Method for fabricating single diffusion break structure directly under a gate line | Wen-Kai Lin, Sheng-Yuan Hsueh, Chih-Kai Kang | 2019-04-09 |
| 10247774 | Test key structure and method of measuring resistance of vias | Hsin-Hsien Chen, Sheng-Yuan Hsueh, Wen-Kai Lin, Chih-Kai Kang | 2019-04-02 |