Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10247774 | Test key structure and method of measuring resistance of vias | Sheng-Yuan Hsueh, Yi-Chung Sheng, Wen-Kai Lin, Chih-Kai Kang | 2019-04-02 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10247774 | Test key structure and method of measuring resistance of vias | Sheng-Yuan Hsueh, Yi-Chung Sheng, Wen-Kai Lin, Chih-Kai Kang | 2019-04-02 |