Issued Patents 2019
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10354832 | Multi-column scanning electron microscopy system | Robert Haynes, John Gerling, Aron Welk, Felipe Fuks, Mehran Nasser-Ghodsi +1 more | 2019-07-16 |
| 10276346 | Particle beam inspector with independently-controllable beams | Brian Duffy, Amir Azordegan | 2019-04-30 |
| 10224177 | Method and system for aberration correction in an electron beam system | Xinrong Jiang, Sameet K. Shriyan | 2019-03-05 |