CK

Chris Kurowski

CI Ciena: 1 patents #61 of 179Top 35%
Overall (2019): #511,888 of 560,194Top 95%
1
Patents 2019

Issued Patents 2019

Patent #TitleCo-InventorsDate
10281523 Techniques and circuits for on-chip jitter and phase noise measurement in a digital test environment Sadok Aouini, Naim Ben-Hamida 2019-05-07