Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10365085 | Method and system for measuring thickness of thin film | Tzong-Daw Wu, Jiun-Shen Chen, Cheng-Chang Hsieh | 2019-07-30 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10365085 | Method and system for measuring thickness of thin film | Tzong-Daw Wu, Jiun-Shen Chen, Cheng-Chang Hsieh | 2019-07-30 |