Issued Patents 2019
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10311186 | Three-dimensional pattern risk scoring | Jaime Bravo, Vikrant Chauhan, Piyush Pathak, Shobhit Malik | 2019-06-04 |
| 10276674 | Method of forming a gate contact structure and source/drain contact structure for a semiconductor device | — | 2019-04-30 |
| 10248754 | Multi-stage pattern recognition in circuit designs | Fadi Batarseh, Karthik Krishnamoorthy, Ahmed Omran | 2019-04-02 |