Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10461690 | Defect inspection method and system for solar cell | En-Yun Wang, Ren-Chin Shr, Yu-Ting Yen, Hsiang-Ying Cheng | 2019-10-29 |
| 10333462 | Measuring apparatus for solar cell | Ren-Chin Shr, En-Yun Wang, Min-An Tsai, Hung-Sen Wu, Teng-Chun Wu +2 more | 2019-06-25 |