Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10444260 | Low force wafer test probe | David M. Audette, Dennis R. Conti, Grant Wagner | 2019-10-15 |
| 10261108 | Low force wafer test probe with variable geometry | David M. Audette, Dennis R. Conti, Grant Wagner | 2019-04-16 |