Issued Patents 2019
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10483083 | Scanning electron microscope and image processing apparatus | Thantip Krasienapibal, Momoyo Enyama, Sayaka KURATA | 2019-11-19 |
| 10361063 | Charged particle detector and charged particle beam device using the same | Momoyo Enyama, Kaori Shirahata, Makoto Sakakibara | 2019-07-23 |
| 10256068 | Charged particle beam apparatus | Momoyo Enyama, Natsuki Tsuno | 2019-04-09 |