Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10216697 | Management system for skin condition measurement analysis information and management method for skin condition measurement analysis information | Masashi Yoshimura, Eiji Sakata, Hironobu Nagano, Kenji Matsuoka, Kengo Miura | 2019-02-26 |