Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10204761 | Charged particle beam device, electron microscope and sample observation method | Takeshi Sunaoshi, Kazutaka Nimura | 2019-02-12 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10204761 | Charged particle beam device, electron microscope and sample observation method | Takeshi Sunaoshi, Kazutaka Nimura | 2019-02-12 |