CY

Chang-Chun Yeh

HM Hermes Microvision: 1 patents #6 of 12Top 50%
Overall (2019): #505,299 of 560,194Top 95%
1
Patents 2019

Issued Patents 2019

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
10274537 Test device for defect inspection — 2019-04-30