Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10247814 | Phase shift detector process for making and use of same | Jason Ryan, Jason Campbell | 2019-04-02 |
| 10241149 | Massively parallel wafer-level reliability system and process for massively parallel wafer-level reliability testing | — | 2019-03-26 |