Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10234500 | Systematic defects inspection method with combined eBeam inspection and net tracing classification | Weihong Gao, Yan Pan, Peter Lin, Hoang Anh Nguyen, Ho-Young Song | 2019-03-19 |