Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10481108 | System for defect indication detection | Xingwei Yang, Paulo Ricardo Mendonca, Christopher Allen Nafis, Patrick Joseph Howard | 2019-11-19 |
| 10203290 | Method for defect indication detection | Xingwei Yang, Paulo Ricardo Mendonca, Christopher Allen Nafis, Patrick Joseph Howard | 2019-02-12 |