Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10330703 | Probe systems and methods including electric contact detection | Sia Choon Beng | 2019-06-25 |
| 10281518 | Systems and methods for on-wafer dynamic testing of electronic devices | Eric Lyell Hill | 2019-05-07 |