Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10515444 | Care area generation for inspecting integrated circuits | Jie Lin | 2019-12-24 |
| 10223615 | Learning based defect classification | Weimin Ma, Jian Zhang | 2019-03-05 |
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10515444 | Care area generation for inspecting integrated circuits | Jie Lin | 2019-12-24 |
| 10223615 | Learning based defect classification | Weimin Ma, Jian Zhang | 2019-03-05 |