Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10481109 | Method for characterizing a sample combining an X-ray characterization technique and a secondary ionization mass spectrometry characterization technique | Agnieszka Priebe, Jean-Paul Barnes | 2019-11-19 |
| 10190953 | Tomography sample preparation systems and methods with improved speed, automation, and reliability | Guillaume Delpy, Laurens Franz Taemsz Kwakman, Chad Rue, Jorge Filevich | 2019-01-29 |