Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10423074 | Method for calculating the metrics of an IC manufacturing process | Mohamed Saib, Patrick J. Schiavone, Thiago Figueiro | 2019-09-24 |
AF
Aurélien Fay
Aselta Nanographics: 1 patents #4 of 4Top 100%
Overall (2019): #534,411 of 560,194Top 100%
1
Patents 2019