CH

Chih-Peng Hsieh

CC Chunghwa Precision Test Tech. Co.: 4 patents #1 of 4Top 25%
Overall (2019): #57,652 of 560,194Top 15%
4
Patents 2019

Issued Patents 2019

Showing 1–4 of 4 patents

Patent #TitleCo-InventorsDate
10514390 Probe structure Wen Tsung LI, Kai-Chieh Hsieh 2019-12-24
10509057 Probe assembly and probe structure thereof Wei-Jhih Su 2019-12-17
10401388 Probe card device and rectangular probe thereof Wei-Jhih Su 2019-09-03
10317429 Bolt type probe 2019-06-11