Issued Patents 2019
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10508996 | System for testing integrated circuit and method for testing integrated circuit | Tomonori Nakamura | 2019-12-17 |
| 10330615 | Analysis system and analysis method | Tomonori Nakamura | 2019-06-25 |
| 10212301 | Image forming apparatus, image forming method, and medium storing a program, with selecting between process executable by image forming apparatus and process executable by external device | — | 2019-02-19 |