Issued Patents 2019
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10444169 | Two-dimensional X-ray detector position calibration and correction with diffraction pattern | — | 2019-10-15 |
| 10416102 | X-ray diffraction device and method to measure stress with 2D detector and single sample tilt | — | 2019-09-17 |
| 10295484 | Method and apparatus for extending angular coverage for a scanning two-dimensional X-ray detector | — | 2019-05-21 |