Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10261427 | Metrology method and apparatus, computer program and lithographic system | Si-Han Zeng, Jen-Yu Fang, Arie Jeffrey Den Boef, Alexander Straaijer, Ching-Yi Hung +1 more | 2019-04-16 |