Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10421267 | Method to monitor additive manufacturing process for detection and in-situ correction of defects | Riley Reese, Hemant Bheda | 2019-09-24 |
| 10391710 | Deposition of non-uniform non-overlapping curvilinear segments of anisotropic filament to form non-uniform layers | — | 2019-08-27 |