Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10345250 | Method of inspecting a sample with a charged particle beam device, and charged particle beam device | Bernhard Mueller, Kulpreet Singh VIRDI, Bernhard Schuler, Ludwig Ledl | 2019-07-09 |