Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10354376 | Technique for measuring overlay between layers of a multilayer structure | Yakov Weinberg, Ishai Schwarzband, Roman Kris, Itay Zauer, Ran Goldman +3 more | 2019-07-16 |
DR
Dhananjay Singh Rathore
Overall (2019): #486,638 of 560,194Top 90%
1
Patents 2019