Issued Patents 2019
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10444274 | Method of inspecting a specimen and system thereof | Zvi Goren, Adi Boehm | 2019-10-15 |
| 10430938 | Method of detecting defects in an object | Doron Portnoy | 2019-10-01 |
| 10296702 | Method of performing metrology operations and system thereof | Ron Katzir, Imry Kissos, Lavi Jacov Shachar, Shaul Cohen, Noam Zac | 2019-05-21 |