Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10161893 | Characterization of material under test (MUT) with electromagnetic impedance spectroscopy | Sarah E. Pluta, John W. Hewitt | 2018-12-25 |
| 9863900 | Planar sensor array for non-destructive evaluation of material using electromagnetic impedance | Sarah E. Pluta, John W. Hewitt | 2018-01-09 |