Issued Patents 2018
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10107859 | Determining test conditions for at-speed transition delay fault tests on semiconductor devices | Jeremy Lee, Pramodchandran Variyam | 2018-10-23 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10107859 | Determining test conditions for at-speed transition delay fault tests on semiconductor devices | Jeremy Lee, Pramodchandran Variyam | 2018-10-23 |