Issued Patents 2018
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10141413 | Wafer strength by control of uniformity of edge bulk micro defects | Pu Chen, Ting-Chun Wang | 2018-11-27 |
IH
I-Che Huang
Overall (2018): #390,994 of 503,207Top 80%
1
Patents 2018