KL

Kyu Hyung Lee

LI Lg Siltron Incorporated: 1 patents #1 of 3Top 35%
📍 Seobyeon-ri, KR: #5 of 10 inventorsTop 50%
Overall (2018): #335,053 of 503,207Top 70%
1
Patents 2018

Issued Patents 2018

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
9857319 Method of measuring depth of damage of wafer — 2018-01-02