Issued Patents 2018
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9863752 | Metrology apparatus for a semiconductor pattern, metrology system including the same and metrology method using the same | Yoon Shik Kang, Joon Seong Hahn | 2018-01-09 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9863752 | Metrology apparatus for a semiconductor pattern, metrology system including the same and metrology method using the same | Yoon Shik Kang, Joon Seong Hahn | 2018-01-09 |