Issued Patents 2018
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10151773 | Scanning probe microscope and probe contact detection method | Masatsugu Shigeno, Kazutoshi Watanabe, Masafumi Watanabe, Hiroyoshi Yamamoto | 2018-12-11 |
| 10048216 | X-ray analyzer | Keiichi Tanaka | 2018-08-14 |
| 10018578 | X-ray analysis device | Satoshi Nakayama, Keiichi Tanaka, Atsushi Nagata | 2018-07-10 |