Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10158325 | Inspection apparatus and inspection method | Hidetoshi Nakanishi, Akira Ito, Masayoshi Tonouchi | 2018-12-18 |
| 10001441 | Modification processing device, modification monitoring device and modification processing method | Hidetoshi Nakanishi, Akira Ito, Masayoshi Tonouchi, Yuji Sakai | 2018-06-19 |