Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10032524 | Techniques for determining local interconnect defects | Jagdish Sabde, Jayavel Pachamuthu | 2018-07-24 |
| 9934872 | Erase stress and delta erase loop count methods for various fail modes in non-volatile memory | Jagdish Sabde, Jayavel Pachamuthu | 2018-04-03 |