Issued Patents 2018
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10008276 | High accuracy leakage detection through low voltage biasing | Jongmin Park | 2018-06-26 |
| 9892791 | Fast scan to detect bit line discharge time | Yen-Lung Li, Jong Hak Yuh, Tai-Yuan Tseng, Kwang Ho Kim, Qui Vi Nguyen | 2018-02-13 |