Issued Patents 2018
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10132865 | Semiconductor chip, test system, and method of testing the semiconductor chip | Seon Kyoo Lee, Jeong-Don Ihm, Byung-Hoon Jeong, Dae Woon Kang, Sang-Lok Kim | 2018-11-20 |