Issued Patents 2018
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9892500 | Method for grouping region of interest of mask pattern and measuring critical dimension of mask pattern using the same | Hyung Joo Lee, Won Joo Park, Byung-Gook Kim, Dong-Hoon Chung | 2018-02-13 |