Issued Patents 2018
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9965851 | Method for inspecting pattern and an apparatus for manufacturing a semiconductor device using the same | Kaiyuan Chi, Seunghune Yang | 2018-05-08 |
KY
Kiho Yang
Overall (2018): #340,119 of 503,207Top 70%
1
Patents 2018