Issued Patents 2018
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10026661 | Semiconductor device for testing large number of devices and composing method and test method thereof | DaiJoon Hyun, Kwangok Jeong | 2018-07-17 |
HW
Hyosig Won
Overall (2018): #391,118 of 503,207Top 80%
1
Patents 2018